Scanning Microwave Profiler

L.A. Valiente, A.D. Haigh, A.A.P. Gibson, G. Parkinson, P.J. Withers, R. Cooper-Holmes
  • September 2006, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/eumc.2006.281002

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http://dx.doi.org/10.1109/eumc.2006.281002

The following have contributed to this page: Professor Philip J Withers