Electro-thermal analysis of RF MEM capacitive switches for high-power applications

Francesco Solazzi, Cristiano Palego, Subrata Halder, James C. M. Hwang, Alessandro Faes, Viviana Mulloni, Benno Margesin, Paola Farinelli, Roberto Sorrentino
  • September 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/essderc.2010.5618174

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http://dx.doi.org/10.1109/essderc.2010.5618174

The following have contributed to this page: Viviana Mulloni