Substantiation of sequential test parameters for mass-produced electronic devices

Y. H. Michlin, O. Shaham, Ya. P. Lumelskii
  • November 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/eeei.2012.6376986

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http://dx.doi.org/10.1109/eeei.2012.6376986

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