Planning of truncated sequential binomial tests via the ASN-increase parameter

Yefim Haim Michlin, Ofer Shaham
  • November 2009, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/comcas.2009.5386017

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http://dx.doi.org/10.1109/comcas.2009.5386017

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