Observation of integrated circuits by optical-fiber-probe-coupled laser terahertz emission microscope

Ryotaro Inoue, Naotsugu Uchida, Masayoshi Tonouchi
  • January 2006, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/cleo.2006.4627811

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http://dx.doi.org/10.1109/cleo.2006.4627811

The following have contributed to this page: Dr Ryotaro Inoue