Comparison of branch point tolerant wavefront reconstructors in the presence of simulated noise effects

  • M. J. Steinbock, J. D. Schmidt, M. W. Hyde
  • March 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/aero.2012.6187160

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http://dx.doi.org/10.1109/aero.2012.6187160

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