Suppression of crack formation in garnet film by using a compound glass underlayer

A. Furuya, C. Baubet, H. Yoshikawa, T. Tanabe, M. Yamamoto, P. Tailhades, L. Bouet, C. Despax, L. Presmanes, A. Rousset
  • IEEE Transactions on Magnetics, July 2001, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/20.951187

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http://dx.doi.org/10.1109/20.951187

The following have contributed to this page: Philippe Tailhades