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  • Parisa Gifani, Hamid Behnam, Farzan Haddadi, Zahra Alizadeh Sani, Maryam Shojaeifard
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tuffc.2015.2493881/mm11

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http://dx.doi.org/10.1109/tuffc.2015.2493881/mm11