Analysis of an n-Unit System with 1-Repair Facility which has Down-time

M.N. Gopalan, Asha Rani Saxena
  • IEEE Transactions on Reliability, October 1977, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tr.1977.5220165

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http://dx.doi.org/10.1109/tr.1977.5220165