Boosted Random Ferns for Object Detection

Michael Villamizar Vergel, Juan Andrade-Cetto, Alberto Sanfeliu, Francesc Moreno-Noguer
  • IEEE Transactions on Pattern Analysis and Machine Intelligence, February 2018, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tpami.2017.2676778
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http://dx.doi.org/10.1109/tpami.2017.2676778

The following have contributed to this page: Dr Juan Andrade-Cetto