Editor's Note

  • Ramin Zabih, Sing Bing Kang, Neil Lawrence, Jiri Matas, Max Welling
  • IEEE Transactions on Pattern Analysis and Machine Intelligence, May 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tpami.2012.75

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http://dx.doi.org/10.1109/tpami.2012.75