Embedded deterministic test points for compact cell-aware tests

  • Cesar Acero, Derek Feltham, Friedrich Hapke, Elham Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
  • October 2015, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/test.2015.7342383

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http://dx.doi.org/10.1109/test.2015.7342383