Thermal characterization of Silicon-on-SiC substrates

  • O. Vallin, D.M. Martin, J. Lu, L.-G. Li, U. Smith, H. Norstrom, J. Olsson
  • October 2008, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/soi.2008.4656298

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http://dx.doi.org/10.1109/soi.2008.4656298

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