Optimized integration processes to achieve highly stable CVD graphene FETs

  • Yun Ji Kim, Sangchul Lee, Young Gon Lee, Chang Goo Kang, Byoung Hun Lee
  • June 2014, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/snw.2014.7348546

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http://dx.doi.org/10.1109/snw.2014.7348546