Characterization of vertical strained SiGe impact ionization MOSFET for ultra-sensitive biosensor application

Ismail Saad, H. Mohd. Zuhir, C. Bun Seng, A. M. Khairul, Bablu Ghosh, N. Bolong, Razali Ismail
  • August 2014, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/smelec.2014.6920819
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The following have contributed to this page: Dr Bablu K Ghosh