Experimental comparative study between the diamond MOSFET and its conventional counterpart in high temperatures environment

  • Egon H. S. Galembeck, Christian Renaux, Denis Flandre, Salvador P. Gimenez
  • October 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/s3s.2013.6716568

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The following have contributed to this page: Dr Salvador Pinillos Gimenez

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