Improved reliability testing with multiaxial electrodynamics vibration

Ed Habtour, Gary S. Drake, Abhijit Dasgupta, Moustafa Al-Bassyiouni, Cholmin Choi
  • January 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/rams.2010.5448050

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http://dx.doi.org/10.1109/rams.2010.5448050

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