Warranty prediction for products with random stresses and usages

  • Huairui Guo, Arai Monteforte, Adamantios Mettas, Doug Ogden
  • January 2009, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/rams.2009.4914653

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http://dx.doi.org/10.1109/rams.2009.4914653