Total ionizing dose effects on the digital performance of irradiated OCTO and conventional fully depleted SOI MOSFET

  • Leonardo Navarenho de Souza Fino, Marcilei Aparecida Guazzelli da Silveira, Christian Renaux, Denis Flandre, Salvador Pinillos Gimenez
  • September 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/radecs.2013.6937375

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