Microdose induced drain leakage effects in power trench MOSFETs: Experiment and modeling

  • Gennady I. Zebrev, Alexander S. Vatuev, Rustem G. Useinov, Vladimir V. Emeliyanov, Vasily S. Anashin, Maxim S. Gorbunov, Valentin O. Turin
  • September 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/radecs.2013.6937359

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http://dx.doi.org/10.1109/radecs.2013.6937359

The following have contributed to this page: Dr Maxim S Gorbunov