Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods

  • Maxim S. Gorbunov, Boris V. Vasilegin, Andrey A. Antonov, Pavel N. Osipenko, Gennady I. Zebrev, Vasily S. Anashin, Vladimir V. Emeliyanov, Alexander I. Ozerov, Rustem G. Useinov, Alexander I. Chumakov, Alexander A. Pechenkin, Andrey V. Yanenko
  • September 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/radecs.2011.6131444

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http://dx.doi.org/10.1109/radecs.2011.6131444

The following have contributed to this page: Dr Maxim S Gorbunov