Controlling the defects of mc-Si ingot in industrial scale during crystallization

Shi-Kai Tzeng, Jui-Pin Wu, Chen-Hao Yang, Lung-Sheng Liao, Kai-An Hao, Jiang-Kang Chou, Yu-Hao Wu, Yu-Chung Chen, Chun-Wen Lai
  • June 2014, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/pvsc.2014.6925571

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http://dx.doi.org/10.1109/pvsc.2014.6925571