Comparative material issues for fast reliable switching in STT-RAMs

  • Kamaram Munira, William A. Soffa, Avik W. Ghosh
  • August 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/nano.2011.6144606

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http://dx.doi.org/10.1109/nano.2011.6144606