Quantitatively analyzing the performance of integrated circuits and their reliability

Edward J Wyrwas, Joseph B Bernstein
  • IEEE Instrumentation and Measurement Magazine, February 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/mim.2011.5704807

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Joseph Bernstein