Integrated total-NO

  • S.-I. Yoon, H.-R. Ahn, J. Yoon, S. Song, Y.-J. Kim
  • January 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/memsys.2011.5734570

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http://dx.doi.org/10.1109/memsys.2011.5734570