A General Line–Line Method for Dielectric Material Characterization Using Conductors With the Same Cross-Sectional Geometry

Xiue Bao, Song Liu, Ilja Ocket, Juncheng Bao, Dominique Schreurs, Shengkang Zhang, Chunyue Cheng, Keming Feng, Bart Nauwelaers
  • IEEE Microwave and Wireless Components Letters, April 2018, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/lmwc.2018.2809041

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Professor Bart K.J.C. Nauwelaers