A General Line–Line Method for Dielectric Material Characterization Using Conductors With the Same Cross-Sectional Geometry

Xiue Bao, Song Liu, Ilja Ocket, Juncheng Bao, Dominique Schreurs, Shengkang Zhang, Chunyue Cheng, Keming Feng, Bart Nauwelaers
  • IEEE Microwave and Wireless Components Letters, April 2018, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/lmwc.2018.2809041

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http://dx.doi.org/10.1109/lmwc.2018.2809041

The following have contributed to this page: Professor Bart K.J.C. Nauwelaers