Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

MikaËl Cimino, HervÉ Lapuyade, Yann Deval, Thierry Taris, Jean-Baptiste Begueret
  • IEEE Journal of Solid-State Circuits, May 2008, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/jssc.2008.920354

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1109/jssc.2008.920354