NBTI aging tolerance in pipeline based designs NBTI

  • Katerina Katsarou, Yiorgos Tsiatouhas, Angela Arapoyanni
  • July 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iolts.2013.6604047

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http://dx.doi.org/10.1109/iolts.2013.6604047

The following have contributed to this page: Yiorgos Tsiatouhas