In-plane anistropies in polycrystalline Ni films induced by Xe bombardment during deposition

  • M. Farle, H. Saffari, E. Kay, S.B. Hagstrom
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/intmag.1992.696532

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The following have contributed to this page: Michael Farle