A new two-stage rao test detector

Chengpeng Hao, Long Cai, Changlong Si, Qi Xu
  • October 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icosp.2010.5655302

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http://dx.doi.org/10.1109/icosp.2010.5655302

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