Elastic instabilities induced large surface strain sensing structures (EILS)

Y. Li, J.G. Terry, S. Smith, A.J. Walton, G. McHale, B. Xu
  • March 2015, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icmts.2015.7106116

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http://dx.doi.org/10.1109/icmts.2015.7106116

The following have contributed to this page: Professor Glen McHale