Optimising test sets for RF components with a defect-oriented approach

  • R. Kheriji, V. Danclon, J.L. Carbonero, S. Mir
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icm.2004.1434597

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http://dx.doi.org/10.1109/icm.2004.1434597