Analysis of the breakdown fault in field voltage withstand test of 500kV SF6 current transformer

  • Yongji Zhang, Yongming Wang, Haitao Huang, Guoshun Zheng, Zhijin Zhang
  • September 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ichve.2012.6357040

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http://dx.doi.org/10.1109/ichve.2012.6357040