Depth measurement based on pixel number variation and Speeded Up Robust Features

Chen-Chien Hsu, Po-Ting Huang, Zhong-Han Cai, Ming-Chih Lu, Yin-Yu Lu
  • September 2014, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icce-berlin.2014.7034300
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http://dx.doi.org/10.1109/icce-berlin.2014.7034300