Characterization of defects on rivets using a eddy current technique with GMRs

Tiago Rocha, Dario Pasadas, A. Lopes Ribeiro, Helena M. Ramos
  • May 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/i2mtc.2012.6229389

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http://dx.doi.org/10.1109/i2mtc.2012.6229389