Assessment of refinishing processes for electronic components in high reliability applications

Chris Bailey, Stoyan Stoyanov, Chris Best, Chunyan Yin, M. O. Alam, Peter Tollafield, Paul Stewart, John Roulston
  • December 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/eptc.2013.6745704

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http://dx.doi.org/10.1109/eptc.2013.6745704