Issues of ICNIRP guidelines when determining compliance with LF exposure limits

  • Valerio De Santis, Mark Douglas, Niels Kuster, Xi L. Chen
  • September 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/emceurope.2012.6396800

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http://dx.doi.org/10.1109/emceurope.2012.6396800

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