Damage mechanics of electronics on metal-backed substrates in harsh environments

  • P. Lall, N. Islam, T. Shete, J. Evans, J. Suhling, S. Gale
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ectc.2004.1319415

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http://dx.doi.org/10.1109/ectc.2004.1319415