Quality assurance in memory built-in self-test tools

  • Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada
  • April 2014, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ddecs.2014.6868760

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http://dx.doi.org/10.1109/ddecs.2014.6868760