ESL: tales from the trenches

  • F. Bacchini, D. Maliniak, T. Doherty, S.A. Pai, Soo-Kwan Eo
  • January 2005, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/dac.2005.193775

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http://dx.doi.org/10.1109/dac.2005.193775