Comparative analysis of switching performance of transistors in SOS process for RF applications

  • Robabeh Amirkhanzadeh, Henrik Sjoland, Ajay Tikka, Mike Faulkner
  • December 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/apccas.2010.5775012

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http://dx.doi.org/10.1109/apccas.2010.5775012