Automatic ship hull inspection using fuzzy logic

  • Contreras Juan, Cuadrado William, Munoz David, Archbold George, Delgado, Geraldine Delgado, Diaz Vladimir
  • October 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/aipr.2012.6528214

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http://dx.doi.org/10.1109/aipr.2012.6528214