Sampling time effects in the ACT device

  • E.G. Bogus, M.J. Hoskins, B.J. Hunsinger
  • IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, July 1991, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/58.84273

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http://dx.doi.org/10.1109/58.84273

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