What is it about?
A parallel high-efficiency class-E PA has been measured to analysis its temperature reliability. This can provide important guidance for the PA reliability design.
Featured Image
Why is it important?
The relationship of temperature with PA reliability may cause more attentions in future years. The temperature reliability is the top concern for the class-E PA in the application stage. All these motivate us to explore the temperature reliability for the class-E PA.
Perspectives
A parallel high-efficiency class-E PA is tested in the study of temperature reliability. The study highlights the reliability at the conditions of temperature cycle and thermal shock. A series of temperature reliability tests have been carried out to explore the relationship between the variation of temperature and DC characteristics, output power, S parameters and efficiency of high-efficiency class-E PA. The performance degradation and even failure are observed at different temperatures, which means that the PA is not high-efficiency again. Maybe it is possible to design the temperature compensating circuit to offset the degradation caused by temperature. All these can give important guidance for PA design.
Haifeng Wu
Read the Original
This page is a summary of: Study of temperature reliability for a parallel high-efficiency class-E power amplifier, Circuit World, August 2017, Emerald,
DOI: 10.1108/cw-09-2016-0039.
You can read the full text:
Contributors
The following have contributed to this page
