Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I

What is it about?

This paper reports computer simulations of the transmitted-beam intensity distribution for the case of six-beam diffraction of X-rays in a perfect silicon crystal of thickness 1 mm. Both the plane-wave angular dependence and the six-beam section topographs, which are usually obtained in experiments with a restricted beam (two-dimensional slit), are calculated.

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Why is it important?

We got new knowledge about interaction of x-ray with matter and found properties of new phenomenon of such interaction

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