Theoretical analysis of reflection high-energy electron diffraction (RHEED) and reflection high-energy positron diffraction (RHEPD) intensity oscillations expected for the perfect layer-by-layer growth

What is it about?

Intensity oscillations for diffracted electrons and positrons are analysed using two different theoretical models. The phase of oscillations, determined employing the precise dynamical calculations is compared with the phase obtained using a qualitative, simplified approach in which only interfering waves and the effect of refraction are considered. It was found that the model with the precise calculations is more suitable for carrying out interpretations of experimental data, however, the simplified model seems to very useful for explaining the origin of the effect of intensity oscillations.

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