What is it about?
X-ray fluorescence microscopy offers quantitative images of elemental concentration. This information can be important for understanding the role of metals in cell, tissue, and organ function. How much flux do you need for what detection level for an element? We present calculations for this, even when the incident x-ray energy is far above the energy of x-ray fluorescence emission lines.
Featured Image
Why is it important?
Previous calculations used rough estimates applicable to tuning the incident excitation photon energy to be just above a fluorescence emission line's energy. In practice, it is common to use a single photon energy (such as 12 kilo-electron-Volts or keV) to excite fluorescence from multiple elements with emission line energies well below that single excitation energy.
Perspectives
This is useful for planning experiments where you know you need to achieve a certain sensitivity for detecting a specified element in your sample.
Professor Chris Jacobsen
Northwestern University
Read the Original
This page is a summary of: X-ray fluorescence microscopy exposure estimates using a single excitation energy, Journal of Synchrotron Radiation, June 2026, International Union of Crystallography,
DOI: 10.1107/s1600577526004923.
You can read the full text:
Contributors
The following have contributed to this page
