On the estimation of statistical uncertainties on powder diffraction and small-angle scattering data from two-dimensional X-ray detectors

X. Yang, P. Juhás, S. J. L. Billinge
  • Journal of Applied Crystallography, July 2014, International Union of Crystallography
  • DOI: 10.1107/s1600576714010516

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http://dx.doi.org/10.1107/s1600576714010516

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