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This page is a summary of: Thin film analysis by X-ray scattering.By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-..., Journal of Applied Crystallography, November 2006, International Union of Crystallography,
DOI: 10.1107/s0021889806034698.
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