A deconvolution method for the reconstruction of underlying profiles measured using large sampling volumes

Y.-S. Xiong, P. J. Withers
  • Journal of Applied Crystallography, May 2006, International Union of Crystallography
  • DOI: 10.1107/s0021889806012210

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http://dx.doi.org/10.1107/s0021889806012210

The following have contributed to this page: Professor Philip J Withers